Core Reliability Metrics

MTTR — Mean Time To Repair

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MTTR = Total Repair Time / Number of Repairs

Key Notes

  • Repair time = detection to full restoration. Lower is better.

Example

(2h + 3h + 1.5h + 2.5h) ÷ 4 repairs = 2.25 hours

Benchmarks

IT Systems: 1–4 hManufacturing: 2–8 hAutomotive: 0.5–2 h

MTBF — Mean Time Between Failures

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MTBF = Total Operating Time / Number of Failures

Key Notes

  • Operating time = time the system is running, excluding downtime.

Example

500 hours ÷ 10 failures = 50 hours

Benchmarks

IT Systems: 8,000+ hManufacturing: 200–2,000 hAutomotive: 500–5,000 h

MTTF — Mean Time To Failure

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MTTF = Total Operating Time / Number of Units Failed

Key Notes

  • Used for non-repairable items. MTTF ≠ MTBF.

Example

10 bulbs × 1,000 h, 5 fail → MTTF = 10,000 ÷ 5 = 2,000 h

Benchmarks

LED Bulbs: 25,000+ hHard Drives: 1.5M hIndustrial Motors: 20,000–50,000 h
A = Uptime / (Uptime + Downtime) ≡ MTBF / (MTBF + MTTR)

Key Notes

  • Expressed as % or decimal. High availability ≥ 99.9% (≤ 8.77 h downtime/year).

Example

MTBF=500h, MTTR=5h → A = 500 ÷ 505 = 99.01%

Benchmarks

5 Nines: 99.999%4 Nines: 99.99%3 Nines: 99.9%

OEE — Overall Equipment Effectiveness

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OEE = Availability × Performance × Quality

Key Notes

  • Availability = Run Time / Planned Production Time
  • Performance = (Ideal Cycle Time × Total Count) / Run Time
  • Quality = Good Count / Total Count

Example

93.8% × 88.9% × 95.0% = 79.2%

Benchmarks

World Class: ≥ 85%Good: 70–85%Poor: < 60%

Downtime Cost

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Cost = (Lost Revenue + Labor Cost + Overhead + Penalty + Repair) × Downtime Hours

Key Notes

  • Includes direct and indirect costs. Used for business case for maintenance investments.

Example

$5,000/h rate × 4 hours downtime = $20,000 total cost

Benchmarks

Automotive: ~$50,000/minSemiconductor: ~$30,000/minE-commerce: ~$5,000/min

Spare Parts Optimization

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P(X ≤ k) = Σ [e⁻λ × λˣ / x!] (Poisson CDF)

Key Notes

  • λ = expected demand per period. k = stock quantity. Targets service level (e.g., 95%).

Example

λ = 3 parts/yr, target 95% SL → stock 5 parts

Benchmarks

High Criticality: 99% SLMedium: 95% SLLow: 90% SL

Advanced Reliability Analysis

Reliability R(t)

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R(t) = e^(−λt) = e^(−t / MTBF)

Key Notes

  • λ = failure rate. t = mission time. Assumes constant failure rate (exponential distribution).

Example

MTBF=1000h, t=100h → R(100) = e^(−0.1) = 90.48%

System Reliability

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Series: Rs = R₁ × R₂ × … × RnParallel: Rs = 1 − (1−R₁)(1−R₂)…(1−Rn)k-of-n: Rs = Σ C(n,i) × Rⁱ × (1−R)^(n−i) for i ≥ k

Key Notes

  • Parallel configurations improve availability through redundancy.

Example

2 components at 90% in parallel → Rs = 1−(0.1×0.1) = 99%

Failure Rate (λ)

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λ = Number of Failures / Total Operating Time

Key Notes

  • Units: failures per hour (fph), or × 10⁻⁶ (FIT). λ = 1 / MTBF.

Example

5 failures ÷ 10,000 hours = 0.0005 fph = 500 FIT

Weibull Analysis

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R(t) = e^−(t/η)^β

Key Notes

  • η = characteristic life (scale parameter)
  • β = shape parameter: β<1 early failures, β=1 random, β>1 wear-out
  • MTTF = η × Γ(1 + 1/β)

Example

β=2, η=1000h → R(500) = e^−(0.5)² = e^−0.25 = 77.9%

Benchmarks

β < 1: Infant mortalityβ = 1: Random failuresβ > 1: Wear-out

FMEA — Risk Priority Number

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RPN = Severity × Occurrence × Detection

Key Notes

  • Each factor rated 1–10. High RPN → prioritize corrective action.

Example

S=8, O=4, D=5 → RPN = 160 (High priority)

Benchmarks

Critical: RPN > 200High: RPN 100–200Low: RPN < 100
%GRR = (σ_GRR / σ_Total) × 100%Where: σ²_Total = σ²_Part + σ²_GRRσ²_GRR = σ²_Repeatability + σ²_Reproducibility

Key Notes

  • %GRR < 10% → acceptable. 10–30% → marginal. > 30% → unacceptable.

Example

σ_GRR=0.05, σ_Total=0.20 → %GRR = 25% (marginal)

Benchmarks

Acceptable: < 10%Marginal: 10–30%Unacceptable: > 30%

Quality & Statistical Tools

Process Capability (Cp / Cpk)

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Cp = (USL − LSL) / (6σ)Cpk = min[ (USL − μ) / 3σ, (μ − LSL) / 3σ ]

Key Notes

  • Cp measures potential; Cpk measures actual (accounts for centering).

Example

USL=205, LSL=195, μ=201, σ=1.2 → Cp=1.39, Cpk=1.11

Benchmarks

Excellent: Cpk ≥ 1.67Capable: Cpk ≥ 1.33Marginal: Cpk 1.0–1.33

DPMO & Sigma Level

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DPMO = (Defects / (Units × Opportunities)) × 1,000,0006σ process: DPMO = 3.4

Key Notes

  • DPU = Defects / Units. Yield = (1 − DPU) × 100%.

Example

12 defects, 1000 units, 3 opportunities → DPMO = 4,000 → ~4.1σ

Benchmarks

6 Sigma: 3.4 DPMO5 Sigma: 233 DPMO4 Sigma: 6,210 DPMO
n = (Z × σ / E)² or n = Z² × p(1−p) / E²

Key Notes

  • Z = confidence z-score (95%→1.96). E = margin of error. σ = std dev.

Example

95% CI, σ=10, E=2 → n = (1.96×10/2)² = 96.04 → 97 samples

Control Chart (X̄-R)

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UCLₓ = X̄̄ + A₂R̄ LCLₓ = X̄̄ − A₂R̄UCL_R = D₄R̄ LCL_R = D₃R̄

Key Notes

  • Constants for n=5: A₂=0.577, D₃=0, D₄=2.114. Points outside limits = special cause.

Example

X̄̄=50, R̄=0.06, n=5 → UCL = 50+0.577×0.06 = 50.035

Pareto Analysis

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Category % = (Category Value / Total) × 100Cumulative % = Σ previous % + Current %

Key Notes

  • 80/20 Rule: ~20% of causes account for ~80% of problems.

Example

A=42%, B=27%, C=15% → Top 2 = 69% of issues

Correlation (Pearson r)

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r = Σ[(xᵢ−x̄)(yᵢ−ȳ)] / √[Σ(xᵢ−x̄)² × Σ(yᵢ−ȳ)²]

Key Notes

  • r ranges −1 to +1. |r| > 0.7 = strong. |r| < 0.3 = weak.

Example

Temperature vs defect rate: r = −0.82 (strong negative correlation)

Benchmarks

Very Strong: |r| ≥ 0.9Strong: |r| 0.7–0.9Weak: |r| < 0.3

Descriptive Statistics

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Mean (x̄) = Σx / nStd Dev (σ) = √[Σ(x−x̄)² / n]CV = (σ / x̄) × 100%

Key Notes

  • CV = coefficient of variation. Describes spread relative to mean.

Example

Data: 10,12,11,13,14 → x̄=12, σ=1.41, CV=11.8%